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X-Ray Line Profile Analysis in Materials Science

X-Ray Line Profile Analysis in Materials Science

Copyright: © 2014 |Pages: 359
ISBN13: 9781466658523|ISBN10: 1466658525|EISBN13: 9781466658530
DOI: 10.4018/978-1-4666-5852-3
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MLA

Gubicza, Jenő. X-Ray Line Profile Analysis in Materials Science. IGI Global, 2014. https://doi.org/10.4018/978-1-4666-5852-3

APA

Gubicza, J. (2014). X-Ray Line Profile Analysis in Materials Science. IGI Global. https://doi.org/10.4018/978-1-4666-5852-3

Chicago

Gubicza, Jenő. X-Ray Line Profile Analysis in Materials Science. Hershey, PA: IGI Global, 2014. https://doi.org/10.4018/978-1-4666-5852-3

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X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field.

X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.

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Front Materials
Title Page
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Copyright Page
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Preface
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Chapters
Back Materials
Compilation of References
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About the Author
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Index
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